We report on the application of a short working distance von Hamos geometry spectrometer\nto measure the inelastic X-ray scattering (IXS) signals from solids and liquids. In contrast to typical\nIXS instruments where the spectrometer geometry is fixed and the incoming beam energy is scanned,\nthe von Hamos geometry allows measurements to be made using a fixed optical arrangement with\nno moving parts. Thanks to the shot-to-shot capability of the spectrometer setup, we anticipate its\napplication for the IXS technique at X-ray free electron lasers (XFELs). We discuss the capability of\nthe spectrometer setup for IXS studies in terms of efficiency and required total incident photon flux\nfor a given signal-to-noise ratio. The ultimate energy resolution of the spectrometer, which is a key\nparameter for IXS studies, was measured to the level of 150 meV at short crystal radius thanks to the\napplication of segmented crystals for X-ray diffraction. The short working distance is a key parameter\nfor spectrometer efficiency that is necessary to measure weak IXS signals.
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